Title :
YBCO step edge junctions on various substrates
Author :
Pettiette-Hall, C.L. ; Luine, J.A. ; Murduck, J. ; Burch, J.F. ; Hu, R. ; Sergant, M. ; St.John, D.
Author_Institution :
Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
We have fabricated YBCO 90/spl deg/ grain boundary junctions on step edges in NdGaO/sub 3/ and in deposited dielectric (CeO/sub 2/ on YSZ and SrTiO/sub 3/ on MgO) in order to compare junction performance to our standard, LaAlO/sub 3/. Average I/sub c/R/sub n/ values at 77 K in the 300-400 /spl mu/V range were measured for 2 /spl mu/m step edge junctions on NdGaO/sub 3/, LaAlO/sub 3/, and SrTiO/sub 3//MgO. Junction I/sub c/ is greatly reduced with the CeO/sub 2//YSZ system. I/sub c/R/sub n/ values in the 300-400 /spl mu/V range were measured at 65 K for 4 /spl mu/m junctions.<>
Keywords :
Josephson effect; barium compounds; grain boundaries; high-temperature superconductors; superconducting junction devices; yttrium compounds; 2 micron; 4 micron; 65 K; 77 K; CeO/sub 2/-ZrO/sub 2/Y/sub 2/O/sub 3/; LaAlO/sub 3/; NdGaO/sub 3/; SrTiO/sub 3/-MgO; YBCO; YBaCuO; YSZ; critical current normal resistance products; dielectric; grain boundary junctions; step edges; substrates; Buffer layers; Dielectric materials; Dielectric measurements; Dielectric substrates; Etching; Fabrication; Grain boundaries; Milling; Pulsed laser deposition; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
