Title :
Schlieren photography of current filaments in surface-related breakdown of silicon
Author :
Hankla, B.J. ; Williams, P.F.
Author_Institution :
Dept. of Electr. Eng., Nebraska Univ., Lincoln, NE, USA
fDate :
2/1/1996 12:00:00 AM
Abstract :
We have used a modified Schlieren technique to photograph current filaments formed inside silicon during the very early stages of surface-related breakdown. We believe that the features we see are due to heating in the filamentary channel. The very rapid formation of these channels suggests that they result from streamer-like phenomena in the bulk silicon
Keywords :
elemental semiconductors; flashover; photography; schlieren systems; silicon; surface discharges; Schlieren photography; Si; current filaments; filamentary channel; heating; semiconductor; streamer-like phenomena; surface-related breakdown; Breakdown voltage; Dielectric breakdown; Electric breakdown; Electrodes; Iris; Lenses; Optical imaging; Photography; Plasma measurements; Silicon;
Journal_Title :
Plasma Science, IEEE Transactions on
