DocumentCode
859994
Title
Critical current density distribution and magnetic flux states in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// bicrystal grain boundary Josephson junctions
Author
Fischer, G.M. ; Mayer, B. ; Schulze, H. ; Gross, R.
Author_Institution
Phys. Inst., Tubingen Univ., Germany
Volume
5
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
2184
Lastpage
2187
Abstract
We have studied the spatial homogeneity of the critical current density J/sub c/ and static magnetic flux states in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// bicrystal grain boundary Josephson junctions (GBJs) using Low Temperature Scanning Electron Microscopy (LTSEM). By LTSEM the J/sub c/ distribution and the static magnetic flux states in the GBJs could be imaged with a resolution of less than 1 /spl mu/m. Varying the applied magnetic field B the different magnetic flux states with up to more than 15 vortices in the GBJ could be observed. The spatial variation of the measured LTSEM voltage signal agrees well with the theoretically expected signal according to the sinusoidal modulation of the maximum Josephson current density by an external magnetic field. The LTSEM analysis clearly demonstrates that the spatial variation of J/sub c/ along the grain boundary is less than about 30% on the length scale of the spatial resolution of the LTSEM technique.<>
Keywords
Josephson effect; barium compounds; critical current density (superconductivity); grain boundaries; high-temperature superconductors; magnetic flux; scanning electron microscopy; superconducting device testing; superconducting junction devices; yttrium compounds; LTSEM; YBa/sub 2/Cu/sub 3/O/sub 7/; applied magnetic field; bicrystal grain boundary Josephson junctions; critical current density distribution; low temperature scanning electron microscopy; maximum Josephson current density; sinusoidal modulation; spatial homogeneity; static magnetic flux states; Critical current density; Grain boundaries; Image resolution; Josephson junctions; Magnetic field measurement; Magnetic flux; Magnetic force microscopy; Scanning electron microscopy; Spatial resolution; Temperature;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.403017
Filename
403017
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