• DocumentCode
    860241
  • Title

    Improved experimental accuracy with a simplified two-port transformation

  • Author

    Williams, John R.

  • Volume
    52
  • Issue
    2
  • fYear
    1964
  • Firstpage
    211
  • Lastpage
    212
  • Keywords
    Admittance measurement; Calibration; Connectors; Distortion measurement; Impedance; Loss measurement; Position measurement; Radio frequency; Reflection; Scattering parameters;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.2844
  • Filename
    1444774