DocumentCode :
860241
Title :
Improved experimental accuracy with a simplified two-port transformation
Author :
Williams, John R.
Volume :
52
Issue :
2
fYear :
1964
Firstpage :
211
Lastpage :
212
Keywords :
Admittance measurement; Calibration; Connectors; Distortion measurement; Impedance; Loss measurement; Position measurement; Radio frequency; Reflection; Scattering parameters;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.2844
Filename :
1444774
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=860241
