Title :
Simultaneous amplification and parametric frequency multiplication in VHF power transistors
Author :
Pulfer, J.K. ; Lindsay, A.E.
Keywords :
Admittance measurement; Calibration; Connectors; Frequency conversion; Frequency measurement; Power measurement; Power transistors; Radio frequency; Radiofrequency amplifiers; Reflection;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.2845
