• DocumentCode
    860278
  • Title

    Variables sampling plans for Weibull distributed lifetimes under sudden death testing

  • Author

    Jun, Chi-Hyuck ; Balamurali, S. ; Lee, Sang-Ho

  • Author_Institution
    Nat. Core Res. Center for Syst. Bio-Dynamics, Pohang Univ. of Sci. & Technol., Kyungbuk, South Korea
  • Volume
    55
  • Issue
    1
  • fYear
    2006
  • fDate
    3/1/2006 12:00:00 AM
  • Firstpage
    53
  • Lastpage
    58
  • Abstract
    Sudden death testing can be utilized for deciding upon the lot acceptance of manufactured parts. Variables single, and double sampling plans are proposed for the lot acceptance of parts whose life follows a Weibull distribution with known shape parameter. The proposed plans are different from the existing ones in that the lot acceptance criteria do not depend on the estimated scale parameter. Design parameters of both sampling plans are determined by using the usual two-point approach. The number of groups is determined independently of the group size, and even independently of the shape parameter. Also, the double sampling plan can reduce the average number of groups required. The effects of mis-specification of the shape parameter on the probability of accepting the lots under the single sampling plan are analyzed & discussed.
  • Keywords
    Weibull distribution; life testing; manufactured products; parameter estimation; Weibull distributed lifetime; double sampling plan; lot acceptance criteria; parameter estimation; sudden death testing; two-point approach; variables sampling plan; Exponential distribution; Industrial engineering; Life testing; Manufacturing; Parameter estimation; Probability distribution; Sampling methods; Shape; Terminology; Weibull distribution; Double sampling; lot acceptance; operating characteristic curve; single sampling;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2005.863802
  • Filename
    1603893