Title :
Monolithically integrated DWDM receiver
Author :
Cremer, C. ; Emeis, N. ; Schier, M. ; Heise, G. ; Ebbinghaus, G.
Author_Institution :
Res. Labs., Siemens AG, Munich, Germany
fDate :
2/1/1993 12:00:00 AM
Abstract :
A grating spectrometer integrated monolithically in the InGaAsP system with a photodiode array for a dense WDM system is presented for the 1.5 μm wavelength region. The chip provides more than 30 wavelength channels with a spacing of 4 nm, a channel crosstalk of approximately -15 dB, an internal photodiode efficiency of 90% and a photodiode capacitance of 0.33 pF. The chip needs no optical adjustments. It is therefore well suited to mass production
Keywords :
III-V semiconductors; crosstalk; diffraction gratings; gallium arsenide; gallium compounds; indium compounds; integrated optoelectronics; multiplexing equipment; optical receivers; photodiodes; spectrometers; wavelength division multiplexing; 0.33 pF; 1.5 micron; 90 percent; IR; InGaAsP system; channel crosstalk; chip; dense WDM system; grating spectrometer; internal photodiode efficiency; mass production; monolithic integration; optical receivers; photodiode array; photodiode capacitance; semiconductors; wavelength channels;
Journal_Title :
Optoelectronics, IEE Proceedings J
