Title :
YBa/sub 2/Cu/sub 3/O/sub 7/(-/spl delta/) a-axis films and planar junctions
Author :
Wichern, R.G. ; Reuvekamp, E.M.C.M. ; Gerritsma, G.J. ; Rogalla, H.
Author_Institution :
Dept. of Appl. Phys., Twente Univ., Enschede, Netherlands
fDate :
6/1/1995 12:00:00 AM
Abstract :
In order to prepare planar junctions, multilayers were sputtered, using YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// as superconductor and PrBa/sub 2/Cu/sub 3/O/sub 7/(-/spl delta/) as barrier material. The sandwiches are a-axis oriented. Out of these, single junctions were etched, planarized with CeO/sub 2/. Finally gold contacts were sputtered. The junctions are squares of size 20/spl times/20 to 100/spl times/100 /spl mu/m/sup 2/. A prerequisite for successful preparation of junctions from a-axis oriented multilayers is a study of such films. Films deposited by RF off-axis sputtering were characterized electrically, Their morphology was investigated by XRD, AFM and TEM. The films are very smooth and have a grain size of below 100/spl times/100 nm/sup 2/. To improve T/sub c/ and crystal quality, template layers were used. The T/sub c/ of a single film is about 62 K; by using a template layer up to 78 K can be reached. For a-axis oriented growth not only a reduction of the deposition temperature is important, but also the growth rate must be high enough. Best results were obtained at rates higher than 150 nm/h. The first planar junctions show a supercurrent, but otherwise rounded I-V curves.<>
Keywords :
Josephson effect; atomic force microscopy; barium compounds; high-temperature superconductors; sputter deposition; superconducting thin films; superconducting transition temperature; transmission electron microscopy; yttrium compounds; 62 K; 78 K; AFM; Au; Au contacts; CeO/sub 2/; CeO/sub 2/ planarization; PrBa/sub 2/Cu/sub 3/O/sub 7/; PrBa/sub 2/Cu/sub 3/O/sub 7/(-/spl delta/) barrier material; RF off-axis sputtering; TEM; XRD; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub 7/(-/spl delta/); a-axis oriented growth; crystal quality; deposition temperature; electrical characterization; grain size; growth rate; morphology; multilayer sputtering; planar junctions; rounded I-V curves; single junction etching; superconducting critical temperature; supercurrent; template layers; Contacts; Gold; Grain size; Josephson junctions; Morphology; Nonhomogeneous media; Radio frequency; Sputter etching; Sputtering; Superconducting materials;
Journal_Title :
Applied Superconductivity, IEEE Transactions on