Title :
Comparison of large signal models for junction transistors
Author :
Hamilton, D.J. ; Lindholm, F.A ; Narud, J.A.
Author_Institution :
University of Arizona, Tucson, Ariz.
fDate :
3/1/1964 12:00:00 AM
Abstract :
The Ebers-Moll, charge control, and Linvill lumped models are systematically derived from a common mathematical origin. Approximations are discussed in detail, and the models are compared on the basis of their ability to represent physical processes, the ease with which they lend themselves to analysis, and the degree of approximation involved. It is shown that all three models are equivalent with regard to over-all degree of approximation, and therefore yield the same results in the solution of large-signal transient problems. However, the lumped model best portrays physical processes and lends itself most easily to intuitive understanding.
Keywords :
Design engineering; Laboratories; Mathematical model; Performance analysis; Semiconductor diodes; Solid state circuits; Sparks; Transient analysis; Transient response; Transistors;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.2867