DocumentCode :
860499
Title :
Comparison of large signal models for junction transistors
Author :
Hamilton, D.J. ; Lindholm, F.A ; Narud, J.A.
Author_Institution :
University of Arizona, Tucson, Ariz.
Volume :
52
Issue :
3
fYear :
1964
fDate :
3/1/1964 12:00:00 AM
Firstpage :
239
Lastpage :
248
Abstract :
The Ebers-Moll, charge control, and Linvill lumped models are systematically derived from a common mathematical origin. Approximations are discussed in detail, and the models are compared on the basis of their ability to represent physical processes, the ease with which they lend themselves to analysis, and the degree of approximation involved. It is shown that all three models are equivalent with regard to over-all degree of approximation, and therefore yield the same results in the solution of large-signal transient problems. However, the lumped model best portrays physical processes and lends itself most easily to intuitive understanding.
Keywords :
Design engineering; Laboratories; Mathematical model; Performance analysis; Semiconductor diodes; Solid state circuits; Sparks; Transient analysis; Transient response; Transistors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.2867
Filename :
1444797
Link To Document :
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