• DocumentCode
    860596
  • Title

    Measurements and modelling of noise in DC-erased thin-film media

  • Author

    Vos, Martin J. ; Tanaka, Yoichiro ; Judy, Jack H.

  • Author_Institution
    Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    2149
  • Lastpage
    2151
  • Abstract
    Experimental and theoretical results are given for the noise produced in thin-film media after reverse DC erasure. The noise spectra produced at high bit densities and at reverse DC erasure around the remanent coercivity look identical. A theoretical spectral model based on Poisson statistics shows a good fit with the measured noise spectra. A novel technique for measuring the medium noise in the spatial domain has been developed. The results obtained in the spatial domain through autocorrelation of the read flux agree well with the noise results obtained in the spectral domain
  • Keywords
    magnetic recording; modelling; noise; DC-erased thin-film media; Poisson statistics; autocorrelation; modelling; noise; read flux; remanent coercivity; spatial domain; theoretical spectral model; Bandwidth; Coercive force; Magnetic field measurement; Magnetic heads; Magnetic materials; Magnetic noise; Micromagnetics; Noise measurement; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104650
  • Filename
    104650