• DocumentCode
    860785
  • Title

    A Simple Route to Fabricate Percolated Perpendicular Magnetic Recording Media

  • Author

    Rahman, M.Tofizur ; Lai, Chih-Huang ; Vokoun, D. ; Shams, Nazmun N.

  • Author_Institution
    Dept. of Material Sci. & Eng., Nat. Tsing Hua Univ., Hsinchu
  • Volume
    43
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    2133
  • Lastpage
    2135
  • Abstract
    A simple approach is proposed for fabrication of percolated perpendicular media (PPM). Nano pore array with pore diameter of 12-15 nm and different pore densities has been prepared by anodizing aluminum on silicon wafers. The pore density increases from 3.2times1010 cm-2 to 11.0times1010 cm-2 with the decrease in anodizing voltage from 30 to 10 V. Then, Pt (7 nm)/{Co (0.5 nm)/Pt (2) nm}5 multilayers are deposited onto this porous anodized alumina (AAO) by sputtering. The pore size is reduced to 10-12 nm after deposition of magnetic layers. The Co/Pt multilayers on AAO exhibit perpendicular magnetic anisotropy, squareness ratios of unity, and negative nucleation fields. The perpendicular coercivity increases linearly with the increase in pore density due to the pinning effect imposed by the pores, which is consistent with theoretical calculation for PPM
  • Keywords
    anodisation; cobalt; coercive force; magnetic multilayers; magnetic recording; nanostructured materials; nucleation; perpendicular magnetic anisotropy; platinum; sputter deposition; 0.5 nm; 2 nm; 7 nm; Co-Pt; Si-Al2O3; anodizing aluminum; anodizing voltage; magnetic layers; multilayers; nanopore array; negative nucleation fields; percolated perpendicular magnetic recording media; perpendicular coercivity; perpendicular magnetic anisotropy; pinning effect; pore densities; pore density; pore diameter; pore size; porous anodized alumina; silicon wafers; sputtering; squareness ratios; Aluminum; Coercive force; Fabrication; Magnetic anisotropy; Magnetic multilayers; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Silicon; Sputtering; Voltage; Anodized aluminum oxide (AAO); Co/Pt multilayers; percolated perpendicular media (PPM); pinning sites;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2007.893142
  • Filename
    4202887