• DocumentCode
    860813
  • Title

    Face Photo-Sketch Synthesis and Recognition

  • Author

    Wang, Xiaogang ; Tang, Xiaoou

  • Author_Institution
    Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
  • Volume
    31
  • Issue
    11
  • fYear
    2009
  • Firstpage
    1955
  • Lastpage
    1967
  • Abstract
    In this paper, we propose a novel face photo-sketch synthesis and recognition method using a multiscale Markov Random Fields (MRF) model. Our system has three components: 1) given a face photo, synthesizing a sketch drawing; 2) given a face sketch drawing, synthesizing a photo; and 3) searching for face photos in the database based on a query sketch drawn by an artist. It has useful applications for both digital entertainment and law enforcement. We assume that faces to be studied are in a frontal pose, with normal lighting and neutral expression, and have no occlusions. To synthesize sketch/photo images, the face region is divided into overlapping patches for learning. The size of the patches decides the scale of local face structures to be learned. From a training set which contains photo-sketch pairs, the joint photo-sketch model is learned at multiple scales using a multiscale MRF model. By transforming a face photo to a sketch (or transforming a sketch to a photo), the difference between photos and sketches is significantly reduced, thus allowing effective matching between the two in face sketch recognition. After the photo-sketch transformation, in principle, most of the proposed face photo recognition approaches can be applied to face sketch recognition in a straightforward way. Extensive experiments are conducted on a face sketch database including 606 faces, which can be downloaded from our Web site (http://mmlab.ie.cuhk.edu.hk/facesketch.html).
  • Keywords
    Markov processes; face recognition; image processing; face recognition; multiscale Markov random fields model; photo-sketch synthesis; query sketch; Applications; Face and gesture recognition; Face recognition; Image-based rendering; face sketch recognition; face sketch synthesis; multiscale Markov random field.; Algorithms; Artificial Intelligence; Biometry; Face; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Paintings; Pattern Recognition, Automated; Photography; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique; User-Computer Interface;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2008.222
  • Filename
    4624272