DocumentCode :
861020
Title :
Physics-based RTD current-voltage equation
Author :
Schulman, J.N. ; De Los Santos, H.J. ; Chow, D.H.
Author_Institution :
Hughes Res. Labs., Malibu, CA, USA
Volume :
17
Issue :
5
fYear :
1996
fDate :
5/1/1996 12:00:00 AM
Firstpage :
220
Lastpage :
222
Abstract :
An analytic expression for the current-voltage characteristics of resonant tunneling diodes is derived from basic principles. The form is ideal for insertion into circuit simulation models. It is demonstrated for a conventional InGaAs-AlAs RTD and for an InAs-AlSb-GaSb RIT diode. The expression is based on the quantum tunneling formalism and contains parameters that originate from physical quantities, but which can also be treated as empirical. Empirical fitting is straightforward and results in an excellent match to the data. Additional levels of physical realism can be incorporated in a natural way.
Keywords :
resonant tunnelling diodes; semiconductor device models; I-V characteristics; InAs-AlSb-GaSb; InGaAs-AlAs; RIT diode; RTD current-voltage equation; circuit simulation models; physics-based I-V equation; quantum tunneling formalism; resonant tunneling diodes; Circuit simulation; Curve fitting; Digital circuits; Diodes; Equations; Fabrication; Predictive models; Resonance; Resonant tunneling devices; Temperature;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.491835
Filename :
491835
Link To Document :
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