DocumentCode :
86104
Title :
Effect of Formic Acid Vapor In Situ Treatment Process on Cu Low-Temperature Bonding
Author :
Wenhua Yang ; Akaike, Masakate ; Suga, Takashi
Author_Institution :
Dept. of Precision Eng., Univ. of Tokyo, Tokyo, Japan
Volume :
4
Issue :
6
fYear :
2014
fDate :
Jun-14
Firstpage :
951
Lastpage :
956
Abstract :
Low-temperature Cu/Cu direct bonding technology using formic acid vapor in situ treatment was developed. Effect of formic acid vapor treatment conditions on Cu surface and bonding was studied. Cu surface oxide was reduced using formic acid vapor in situ treatment at 150 and 200°C, respectively. With higher temperature and longer treatment time, surface reduction is more effective. Grain boundary etching was found on chemical mechanical polished Cu film after initial treatment by formic acid. However, Cu surface roughness is minimally influenced by long-time formic acid vapor treatment. Cu film/Cu film direct bonding was realized in N2 atmosphere with formic acid vapor in situ treatment under temperature below 200°C. For lower treatment temperature, longer treatment time is required to achieve good bonding. The bonding strength is about 9.0 MPa when Cu surface is treated at 200°C for 10 min.
Keywords :
chemical mechanical polishing; copper; etching; integrated circuit bonding; surface roughness; Cu; N2; bonding strength; chemical mechanical polishing; copper surface oxide; formic acid vapor in situ treatment; grain boundary etching; low-temperature Cu direct bonding technology; surface roughness; temperature 150 degC to 200 degC; time 10 min; Atmosphere; Bonding; Rough surfaces; Surface morphology; Surface roughness; Surface topography; Surface treatment; Cu/Cu direct bonding; formic acid vapor; low temperature;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2014.2315761
Filename :
6802361
Link To Document :
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