Title :
Low-Noise Crystalline Soft Underlayer for CoCrPt:SiO2 Perpendicular Recording Media
Author :
Shi, J.Z. ; Piramanayagam, S.N. ; Zhao, J.M. ; Mah, C.S. ; Kay, Y.S. ; Ong, C.Y.
Author_Institution :
Data Storage Inst.
fDate :
6/1/2007 12:00:00 AM
Abstract :
In this paper, a crystalline soft underlayer with chemical formula (Fe15Co85)94Cr3Ta3 for CoCrPt:SiO2-based perpendicular media is studied. Three kinds of approaches are used to successfully reduce the noise from the soft underlayer. X-ray diffraction is used to study the effect of the preparation parameters on the orientations of the soft underlayer and the recording layer. The mechanism for the noise reduction is discussed
Keywords :
X-ray diffraction; chromium alloys; cobalt alloys; crystal microstructure; ferromagnetic materials; granular materials; iron alloys; magnetic recording noise; magnetic thin films; metallic thin films; perpendicular magnetic recording; platinum alloys; silicon compounds; soft magnetic materials; tantalum alloys; (Fe15Co85)94Cr3Ta 3; CoCrPt:SiO2; SUL orientation; X-ray diffraction; granular perpendicular recording media; low-noise crystalline soft underlayer; noise reduction; recording layer orientation; soft underlayer microstructure; Argon; Chromium; Crystallization; Iron; Low-frequency noise; Magnetic noise; Microstructure; Noise reduction; Optical noise; Perpendicular magnetic recording; Crystalline soft underlayer; noise; orientation; perpendicular recording media;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2007.893838
