Title :
Reduced temperature processing of YSZ buffer layers for HTSC transition edge bolometers
Author :
Burnus, M. ; Heidenblut, T. ; Hefle, G. ; Semtchinova, O.K. ; Schwierzi, B. ; Michalke, W. ; Steinbeiss, E. ; Neff, H. ; Laukemper, J.
Author_Institution :
Inst. fur Halbleitertechnologie und Werkstoffe der Elektrotechnik, Hannover Univ., Germany
fDate :
6/1/1995 12:00:00 AM
Abstract :
Using the steep change in the resistance at the superconducting transition edge a sensitive and spectral broadband membrane type bolometric detector prototype was developed. Response S, noise equivalent power NEP and the time constant /spl tau/ were examined. Employing inhibit technology and prefabrication of silicon membranes, the developed process sequence clearly separates the fabrication into silicon processing technology and commonly explored HT/sub c/-superconductor deposition with impact on cost effective future batch fabrication. Buffer layer epitaxy at reduced deposition temperature improves production yield (membranes!) and a recently developed passivation technique saves process steps. Applying the maximum bias current the bolometer prototypes already reveal detectivities in excess of 1/spl times/10/sup 8/ [cm Hz/sup 1/2/ W/sup -1/] and a time constant of the order of milliseconds.<>
Keywords :
bolometers; electron device manufacture; high-temperature superconductors; superconducting device noise; superconductor-semiconductor boundaries; HTSC transition edge bolometers; YSZ buffer layers; ZrO/sub 2/Y/sub 2/O/sub 3/-Si; detectivities; epitaxy; fabrication; inhibit technology; noise equivalent power; passivation; production yield; reduced temperature processing; silicon membranes; time constant; Biomembranes; Bolometers; Buffer layers; Fabrication; Prototypes; Silicon; Superconducting device noise; Superconducting epitaxial layers; Superconducting transition temperature; Temperature sensors;
Journal_Title :
Applied Superconductivity, IEEE Transactions on