Title :
Benchmarking NaI(Tl) electron energy resolution measurements
Author :
Mengesha, W. ; Valentine, J.D.
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
10/1/2002 12:00:00 AM
Abstract :
A technique for validating electron energy resolution ηe results measured using the modified Compton coincidence technique (MCCT) has been developed. This technique relies on comparing measured gamma-ray energy resolution ηγ with calculated values that were determined using the measured ηe results. These ηγ calculations were based on Monte Carlo photon transport simulations, the measured NaI(Tl) electron response, a simplified cascade sequence, and the measured ηe results. To demonstrate this technique, MCCT-measured NaI(Tl) ηe results were used along with measured ηγ results from the same NaI(Tl) crystal. Agreement to within 5% was observed for all energies considered between the calculated and measured ηγ results for the NaI(Tl) crystal characterized. The calculated ηγ results were also compared with previously published ηγ measurements with good agreement (< 10%). In addition to describing the validation technique that was developed in this study and the results, a brief review of the ηe measurements made using the MCCT is provided. Based on the results of this study, it is believed that the MCCT-measured ηe results are reliable. Thus, the MCCT and this validation technique can be used in the future to characterize the ηe of other scintillators and to determine NaI(Tl) intrinsic energy resolution.
Keywords :
Monte Carlo methods; coincidence techniques; electron detection; photon transport theory; sodium compounds; solid scintillation detectors; tellurium; ηγ; ηe; Monte Carlo photon transport; NaI(Tl) detector; NaI:Tl; electron energy resolution; electron response; gamma-ray energy resolution; modified Compton coincidence technique; Cathodes; Convolution; Electrons; Energy measurement; Energy resolution; Gamma rays; Laboratories; Monte Carlo methods; Photonic crystals; Production;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2002.803890