• DocumentCode
    861461
  • Title

    Thermal noise and bit error rate limits in nanoscale memories

  • Author

    Forbes, L. ; Mudrow, M. ; Wanalertlak, W.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR, USA
  • Volume
    42
  • Issue
    5
  • fYear
    2006
  • fDate
    3/2/2006 12:00:00 AM
  • Firstpage
    279
  • Lastpage
    280
  • Abstract
    Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.
  • Keywords
    error statistics; integrated circuit noise; integrated memory circuits; nanoelectronics; thermal noise; BER; bit error rate limits; nanoscale memories; thermal noise;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20063803
  • Filename
    1604863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=861461