Title :
Optical performance of integrated 1.5 mu m grating wavelength-demultiplexer on InP-based waveguide
Author :
Gibbon, M. ; Thompson, G.H.B. ; Clements, Stephen J. ; Moule, D.J. ; Rogers, C.B.
Author_Institution :
STC Technol. Ltd., Harlow, UK
Abstract :
The performance of a monolithic spectrometer operating by total internal reflection of a slab-guided mode from vertical dry-etched mirrors is reported. The demultiplexer is based on a single-moded waveguide formed by the epitaxial growth of a layer of GaInAsP on an InP substrate. Device outputs are almost diffraction-limited and exhibit a signal-to-noise ratio of 15-20 dB. Losses for the collimating mirrors and the grating are 2 and 2.5 dB, respectively.
Keywords :
III-V semiconductors; diffraction gratings; frequency division multiplexing; gallium arsenide; gallium compounds; indium compounds; integrated optics; multiplexing equipment; optical waveguide components; spectrometers; 1.5 micron; 15 to 20 dB; 2 dB; 2.5 dB; GaInAsP-InP; III-V semiconductors; InP substrate; InP-based waveguide; WDM; collimating mirrors; epitaxial growth; integrated grating; losses; monolithic spectrometer; single-moded waveguide; slab-guided mode; total internal reflection; vertical dry-etched mirrors; wavelength-demultiplexer;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890963
