DocumentCode
861718
Title
Measurement of noise in image orthicon
Author
Odagawa, K.
Volume
52
Issue
4
fYear
1964
fDate
4/1/1964 12:00:00 AM
Firstpage
445
Lastpage
445
Keywords
Circuit noise; Diodes; Electrical resistance measurement; Frequency measurement; Lighting; Noise measurement; Pulse measurements; Signal to noise ratio; Silicon compounds; TV;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1964.2979
Filename
1444909
Link To Document