DocumentCode :
861823
Title :
Microstructure Evolution of Ni _{80} Fe _{20} –Cu Deposited by Electroplating Under an Applie
Author :
Yi, J.B. ; Li, X.P. ; Ding, J. ; Yin, J.H. ; Thongmee, S. ; Seet, H.L.
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci. & Eng., Nat. Univ. of Singapore
Volume :
43
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
2980
Lastpage :
2982
Abstract :
A study of the microstructure evolution of Ni80Fe20-Cu composite wires made by electrodeposition under an applied magnetic field is presented. Ni80Fe20-Cu composite wire samples were deposited by electroplating under an applied field parallel to the wire axis and varying from 0 to 400 Oe. Magnetoimpedence (MI) measurement showed that the magnitude of MI first scaled with the increasing of the applied field until the field was larger than 200 Oe. Further increasing the applied field led to the reduction of MI effect. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) indicated that the surface deposited under the applied field of 200 Oe was the best in terms of smoothness and uniformity, indicating that the applied field affected the growth of the deposited layers. The composite wire under 200 Oe applied field possessed a low coercivity (0.35 Oe) and small grain size, which may be attributed to the high MI effect. The surface morphology change is due to the magnetohydrodynamic (MHD) effect
Keywords :
Permalloy; atomic force microscopy; coercive force; composite materials; copper; electroplating; ferromagnetic materials; grain size; magnetohydrodynamics; magnetoresistance; scanning electron microscopy; surface morphology; AFM; Ni80Fe20-Cu; SEM; atomic force microscopy; coercivity; composite wires; electrodeposition; electroplating; grain size; magnetohydrodynamic effect; magnetoimpedance; microstructure evolution; scanning electron microscopy; surface morphology; Atomic force microscopy; Atomic layer deposition; Atomic measurements; Iron; Magnetic field measurement; Magnetohydrodynamics; Microstructure; Scanning electron microscopy; Surface morphology; Wire; Applied field; composite wire; electrodeposition; magnetoimpedence (MI);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2007.893416
Filename :
4202978
Link To Document :
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