Title :
Oscillation of Low-Bias Tunnel Conductance With Applied Magnetic Field in Manganite/Alumina Tunnel Structures
Author :
Luo, Yuansu ; Samwer, Konrad
Author_Institution :
I. Phys. Inst., Gottingen Univ.
fDate :
6/1/2007 12:00:00 AM
Abstract :
We present magnetotransport measurements on tunnel structures Ir/LCMO/Al2O3/LCMO/Al, where the Ir and Al layers were used to guarantee the homogeneity of tunnel current. Epitaxial growth of Ir and LCMO layers on MgO(001) was confirmed by X-ray diffractions. At TLtTc, the junction exhibits a large tunneling magnetoresistance (TMR) of about 210% (5 K, low-field effect). However, near Tc the tunneling conductance G becomes oscillatory with increased magnetic field H, as the bias voltage V drops down below 0.2 V, accompanied with a huge large-field magnetoresistance (MR) (1220% at 14 mV and 70 kOe) and a large extra low-field MR (430% at 1 mV and 5 kOe). For V>0.2 V, the magnetotransport behavior becomes simply colossal MR (CMR)-like. The novel behaviors observed near Tc could be attributed to the field-induced enhancement in density of, for example, electron state near the Fermi level
Keywords :
X-ray diffraction; alumina; aluminium; calcium compounds; colossal magnetoresistance; electronic density of states; iridium; lanthanum compounds; magnetic epitaxial layers; metal-insulator boundaries; tunnelling magnetoresistance; 14 mV; 5 K; Fermi level; Ir-La0.67Ca0.33MnO3-Al2 O3-Al; X-ray diffraction; colossal magnetoresistance; electron state density; epitaxial growth; large field magnetoresistance; low bias tunnel conductance oscillation; manganite/alumina tunnel structures; tunneling magnetoresistance; Colossal magnetoresistance; Current measurement; Electrons; Epitaxial growth; Magnetic field measurement; Magnetic fields; Magnetic tunneling; Tunneling magnetoresistance; Voltage-controlled oscillators; X-ray diffraction; Manganite oxide; tunneling magnetoresistance;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2007.893692