Title :
Analysis of sneak paths and sense-line distortion in an improved capacitor read-only memory
Author :
Kaufman, Alvin B. ; Taub, D.M.
fDate :
5/1/1964 12:00:00 AM
Keywords :
Boundary conditions; Capacitance; Capacitors; Degradation; Electric variables; Mathematics; Nonlinear distortion; Partial differential equations; Resonance; Resonant frequency;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.3035
