DocumentCode :
862608
Title :
Co-doped-YBCO SNS junctions for superconductive integrated circuits
Author :
Lee, A.E. ; Luine, J.A. ; Pettiette-Hall, C.L.
Author_Institution :
Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
2980
Lastpage :
2983
Abstract :
We have established a high temperature superconductor SNS junction fabrication process and are reproducibly fabricating junctions whose behavior is rooted in the physics of the proximity effect. SNS edge junctions are being fabricated using YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7-/spl delta// (Co-YBCO) as the normal barrier, and YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) as the superconductor. In the small junction regime, the junctions have RSJ characteristics with I/sub c/R/sub n//spl sim/ 50 /spl mu/V at 77 K. Junction normal resistance values are consistent with known values of the barrier bulk resistivity and junction geometry, indicating that the interface resistance between YBCO and Co-YBCO is not significant. We have demonstrated I/sub c/ and R/sub n/ 1-/spl sigma/ spreads of 33% and 17%, respectively, for 6-junction strings. Barrier thickness and/or morphology variations appear to significantly contribute to these spreads.<>
Keywords :
Josephson effect; barium compounds; cobalt; high-temperature superconductors; proximity effect (superconductivity); superconducting integrated circuits; yttrium compounds; Co-doped-YBCO; SNS edge junctions; YBCO/Co-YBCO/YBCO; YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/-YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7/-YBa/sub 2/Cu/sub 3/O/sub 7/; critical current; fabrication; high temperature superconductor; interface resistance; normal resistance; proximity effect; resistively shunted junction; superconductive integrated circuits; Conductivity; Fabrication; High temperature superconductors; Josephson junctions; Physics; Proximity effect; Superconducting devices; Superconducting integrated circuits; Superconductivity; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.403218
Filename :
403218
Link To Document :
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