• DocumentCode
    862608
  • Title

    Co-doped-YBCO SNS junctions for superconductive integrated circuits

  • Author

    Lee, A.E. ; Luine, J.A. ; Pettiette-Hall, C.L.

  • Author_Institution
    Space & Electron. Group, TRW Inc., Redondo Beach, CA, USA
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    2980
  • Lastpage
    2983
  • Abstract
    We have established a high temperature superconductor SNS junction fabrication process and are reproducibly fabricating junctions whose behavior is rooted in the physics of the proximity effect. SNS edge junctions are being fabricated using YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7-/spl delta// (Co-YBCO) as the normal barrier, and YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) as the superconductor. In the small junction regime, the junctions have RSJ characteristics with I/sub c/R/sub n//spl sim/ 50 /spl mu/V at 77 K. Junction normal resistance values are consistent with known values of the barrier bulk resistivity and junction geometry, indicating that the interface resistance between YBCO and Co-YBCO is not significant. We have demonstrated I/sub c/ and R/sub n/ 1-/spl sigma/ spreads of 33% and 17%, respectively, for 6-junction strings. Barrier thickness and/or morphology variations appear to significantly contribute to these spreads.<>
  • Keywords
    Josephson effect; barium compounds; cobalt; high-temperature superconductors; proximity effect (superconductivity); superconducting integrated circuits; yttrium compounds; Co-doped-YBCO; SNS edge junctions; YBCO/Co-YBCO/YBCO; YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//; YBa/sub 2/Cu/sub 3/O/sub 7/-YBa/sub 2/Cu/sub 2.8/Co/sub 0.2/O/sub 7/-YBa/sub 2/Cu/sub 3/O/sub 7/; critical current; fabrication; high temperature superconductor; interface resistance; normal resistance; proximity effect; resistively shunted junction; superconductive integrated circuits; Conductivity; Fabrication; High temperature superconductors; Josephson junctions; Physics; Proximity effect; Superconducting devices; Superconducting integrated circuits; Superconductivity; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.403218
  • Filename
    403218