DocumentCode :
862668
Title :
Rapid single flux quantum random access memory
Author :
Polonsky, S.V. ; Kirichenko, A.F. ; Semenov, V.K. ; Likharev, Konstantin K.
Author_Institution :
State Univ. of New York, Stony Brook, NY, USA
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
3000
Lastpage :
3005
Abstract :
A new design concept for the Josephson-junction random access memory (RAM) has been developed. In contrast to previous RAMs based on single flux quantization (SFQ), in our system READ and WRITE operations employ ballistic transfer of SFQ pulses along bit lines (either Josephson transmission lines, or passive superconducting microstrip lines, or their combination). The basic memory cells are the single-junction SQUIDs, connected serially by the bit lines and inductively coupled to word lines. READ and WRITE operations are performed by sending SFQ pulses in appropriate directions along bit lines, and DC currents of appropriate polarity into word lines. This approach allows design of very dense memories with n/spl les/2 Josephson junctions per bit, memory cell area smaller than 80 /spl lambda//sup 2/ (where /spl lambda/ is the minimum feature size), and the critical parameter margin well above /spl plusmn/20%. In this paper we present the general structure of the RSFQ RAM, as well as design and results of testing of the basic memory cell and decoder circuitry using Hypres´ 3.5-/spl mu/m, 1-kA/cm/sup 2/ Nb-trilayer technology.<>
Keywords :
Josephson effect; SQUIDs; decoding; random-access storage; superconducting memory circuits; 3.5 micron; Josephson junction RAM; Nb; Nb-trilayer technology; RSFQ RAM; SFQ pulses; ballistic transfer; decoder circuitry; random access memory; rapid single flux quantum RAM; single flux quantization; single-junction SQUIDs; very dense memories; Circuit testing; Couplings; Decoding; Josephson junctions; Microstrip; Quantization; Random access memory; Read-write memory; SQUIDs; Superconducting transmission lines;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.403223
Filename :
403223
Link To Document :
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