DocumentCode :
862747
Title :
Suppression of extrinsic resolution limiting factors in epitaxial superconducting tunnel junction detectors
Author :
Porter, F.S. ; Van Vechten, D. ; Blamire, M.G. ; Kirk, E.C.G.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
3026
Lastpage :
3029
Abstract :
Superconducting tunnel junctions have been shown to have potential as high resolution X-ray detectors. Recent reductions in the noise environment of our experiment have yielded a substantial increase in the resolution of our Nb/Ta junctions. The junctions used in the experiment are epitaxial base layer devices including a thick Ta absorber and have survived more than 30 cycles to low temperatures. Current experiments with a /sup 55/Fe source have yielded an energy resolution of 68 eV at 5.89 keV with a quantum efficiency of 13%. Additional measurements using a higher energy /sup 109/Cd source are also reported. We discuss how a reduction of extrinsic and quasi-extrinsic noise sources affects the performance of the detectors and why we believe we are still not observing the intrinsic limitations of these junctions.<>
Keywords :
X-ray detection; niobium; superconducting device noise; superconducting epitaxial layers; superconducting particle detectors; tantalum; /sup 109/Cd source; /sup 55/Fe source; 13 percent; 5.89 keV; Nb-Ta; Nb/Ta junctions; Ta absorber; X-ray detectors; energy resolution; epitaxial base layer devices; noise; quantum efficiency; superconducting tunnel junctions; Energy resolution; Josephson junctions; Niobium; Noise reduction; Semiconductor counters; Superconducting device noise; Superconducting epitaxial layers; Temperature; Working environment noise; X-ray detectors;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.403229
Filename :
403229
Link To Document :
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