Author :
Eiseman, S. ; Etkin, A. ; Foley, K.J. ; Longacre, R.S. ; Love, W.A. ; Morris, T.W. ; Ozaki, S. ; Platner, E.D. ; Polychronakos, V.A. ; Saulys, A.C. ; Wheeler, C.D. ; Lindenbaum, S.J. ; Kramer, M.A. ; Teramoto, Y.
Abstract :
A description of this highly integrated drift chamber system is presented. This high resolution and deadtimeless apparatus achieves excellent performance without channel-by-channel parameter corrections. This approach is suited for very large drift chamber systems since it contains an average of less than one active component per channel. In addition to a description of the system, results from beam tests, and actual use in an experiment are discussed.
