DocumentCode :
862850
Title :
30 THz mixing experiments on high temperature superconducting Josephson junctions
Author :
Grossman, E.N. ; Vale, L.R. ; Rudman, D.A. ; Evenson, K.M. ; Zink, L.R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
5
Issue :
2
fYear :
1995
fDate :
6/1/1995 12:00:00 AM
Firstpage :
3061
Lastpage :
3064
Abstract :
We have investigated YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// superconductor-normal-superconductor Josephson junctions as mixers of 30 THz radiation. We have directly observed (2nd order) difference frequencies from 10 MHz to 12.8 GHz between two CO/sub 2/ laser lines. Applying a third microwave signal to the junction, we have observed CO/sub 2/ laser difference frequencies up to 27 GHz. The d.c. bias dependence of the difference frequency signal, as well as other evidence, suggests two distinct mixing mechanisms: hot-electron mixing in the junction banks at high d.c. biases, and bolometric Josephson mixing at low d.c. biases. The latter is the first observation of Josephson mixing at CO/sub 2/ laser frequencies in high-T/sub c/ junctions. The Josephson mixing has generated observable mixing products up to 6th order.<>
Keywords :
barium compounds; bolometers; carbon compounds; gas lasers; high-temperature superconductors; laser accessories; superconducting device testing; superconducting junction devices; yttrium compounds; 10 MHz to 12.8 GHz; 30 THz; DC bias dependence; YBa/sub 2/Cu/sub 3/O/sub 7/; bolometric Josephson mixing; difference frequencies; high temperature superconductors; high-T/sub c/ junctions; hot-electron mixing; laser frequencies; observable mixing products; superconducting mixers; superconductor-normal-superconductor Josephson junctions; Bandwidth; Electrons; Frequency; High temperature superconductors; Josephson junctions; Masers; Microwave measurements; Superconducting device noise; Superconducting microwave devices; Yttrium barium copper oxide;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.403238
Filename :
403238
Link To Document :
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