Title :
High-resolution superconducting X-ray spectrometers with aluminum trapping layers of different thicknesses
Author :
Mears, C.A. ; Labov, S.E. ; Hiller, L.H. ; Frank, M. ; Netel, H. ; Azgui, F. ; Barfknecht, A.T.
Author_Institution :
Lab. for Exp. Astrophys., Lawrence Livermore Nat. Lab., CA, USA
fDate :
6/1/1995 12:00:00 AM
Abstract :
Superconducting tunnel junctions coupled to superconducting absorbers may be used as high-resolution, high-efficiency X-ray spectrometers. We have tested devices with niobium X-ray absorbing layers coupled to aluminum layers that serve as quasiparticle traps. We present a study of device performance as a function of thickness of the trapping layers. We measured the best energy resolution using a device with a high-quality barrier and 200 nm-thick trapping layers on both sides of the tunnel barrier. This energy resolution was 36 eV full width at half maximum at 6 keV, about 4 times better than that obtainable using semiconductor ionization detectors.<>
Keywords :
X-ray absorption; X-ray detection; X-ray spectrometers; aluminium; niobium; quasiparticles; superconducting particle detectors; superconductive tunnelling; superconductor-insulator-superconductor devices; 6 keV; Nb-Al; X-ray absorbing layers; energy resolution; full width at half maximum; quasiparticle traps; superconducting X-ray spectrometers; superconducting absorbers; superconducting tunnel junctions; trapping layer thickness; tunnel barrier; Aluminum; Energy measurement; Energy resolution; Extraterrestrial measurements; Josephson junctions; Laboratories; Magnetic field measurement; Niobium; Spectroscopy; Superconducting epitaxial layers;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
