Title :
Characterization of Andreev reflection barriers by low frequency noise spectroscopy in all-thin-film superconducting point contacts
Author :
Hamasaki, K. ; Ikuta, T. ; Tachibana, A. ; Fukumoto, T.
Author_Institution :
Dept. of Electr. Eng., Nagaoka Univ. of Technol., Niigata, Japan
fDate :
6/1/1995 12:00:00 AM
Abstract :
Low-frequency noise properties of all-thin-film superconducting point contacts have been investigated. Device characterization is also reported here. The quasi particle behavior is well explained by the Andreev reflection. The low-frequency noise spectral density scaled by frequency and normal resistance is studied as a function of junction (contact) resistance.<>
Keywords :
Josephson effect; magnesium compounds; niobium; point contacts; quasiparticles; superconducting device noise; superconducting device testing; superconducting thin films; superconductor-insulator-superconductor devices; type II superconductors; Andreev reflection barriers; Nb-MgO-Nb; SIS devices; device characterization; junction resistance; low frequency noise spectroscopy; quasi particle behavior; spectral density; superconducting point contacts; Acoustic reflection; Acoustical engineering; Contacts; Dielectrics and electrical insulation; Josephson junctions; Low-frequency noise; Niobium; Spectroscopy; Superconducting device noise; Superconducting films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
