Title :
A Status Report of FASTBUS at KEK
Author :
Arai, Y. ; Inoue, E. ; Karita, Y. ; Murakami, T. ; Endo, I. ; Yamashita, T. ; Shimokoshi, F.
Author_Institution :
KEK, National Laboratory for High Energy Physics Oho-Machi, Tsukuba-Gun, Ibaraki 305, Japan
Abstract :
Some FASTBUS modules have been produced and successfully tested at KEK. The test system consisted of a single backplane segment equipped with ancillary logic, two masters driven by the MC68000 microprocessor and two slaves which have several read/write registers. A simple FASTBUS-CAMAC interface is also described.
Keywords :
Circuit testing; Data acquisition; Driver circuits; Fastbus; Laboratories; Logic testing; Physics; Registers; Springs; System testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332264
