Robust Data-Optimized Stochastic Analog-to-Digital Converters

Author

Nguyen, Thin

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR

Volume

55

Issue

6

fYear

2007

fDate

6/1/2007 12:00:00 AM

Firstpage

2735

Lastpage

2740

Abstract

The majority of analog-to-digital converters (ADCs) are designed without taking into consideration the distribution of input signal. In this correspondence, we present a novel ADC architecture that is optimized for a given input signal´s statistics. The new robust data-optimized stochastic flash (RDSF) ADC achieves robustness and high accuracy by employing a) a large number of 1-bit quantizers operating in parallel with an additive noise and b) a novel probability density transform (PDT). We demonstrate the performance gain of the RDSF over the conventional flash ADC using simulations and theoretical analysis

Keywords

probability; quantisation (signal); signal denoising; 1-bit quantizers; additive noise; analog-to-digital converters; data-optimized stochastic flash ADC; input signal statistics; probability density transform; robust data-optimized stochastic converters; Additive noise; Analog-digital conversion; Analytical models; Noise robustness; Performance gain; Probability; Signal design; Statistical distributions; Stochastic processes; Stochastic resonance; Data converters; quantization;

fLanguage

English

Journal_Title

Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1053-587X

Type

jour

DOI

10.1109/TSP.2007.893938

Filename

4203102