DocumentCode :
863193
Title :
Robust Data-Optimized Stochastic Analog-to-Digital Converters
Author :
Nguyen, Thin
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Oregon State Univ., Corvallis, OR
Volume :
55
Issue :
6
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
2735
Lastpage :
2740
Abstract :
The majority of analog-to-digital converters (ADCs) are designed without taking into consideration the distribution of input signal. In this correspondence, we present a novel ADC architecture that is optimized for a given input signal´s statistics. The new robust data-optimized stochastic flash (RDSF) ADC achieves robustness and high accuracy by employing a) a large number of 1-bit quantizers operating in parallel with an additive noise and b) a novel probability density transform (PDT). We demonstrate the performance gain of the RDSF over the conventional flash ADC using simulations and theoretical analysis
Keywords :
probability; quantisation (signal); signal denoising; 1-bit quantizers; additive noise; analog-to-digital converters; data-optimized stochastic flash ADC; input signal statistics; probability density transform; robust data-optimized stochastic converters; Additive noise; Analog-digital conversion; Analytical models; Noise robustness; Performance gain; Probability; Signal design; Statistical distributions; Stochastic processes; Stochastic resonance; Data converters; quantization;
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/TSP.2007.893938
Filename :
4203102
Link To Document :
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