DocumentCode :
86333
Title :
Monolithic Pixel Sensors for Fast Silicon Vertex Trackers in a Quadruple Well CMOS Technology
Author :
Zucca, Stefano ; Gaioni, L. ; Ratti, Lodovico ; Re, V. ; Traversi, Gianluca ; Bettarini, S. ; Forti, F. ; Morsani, Fabio ; Rizzo, Gianluca ; Bosisio, Luciano ; Rashevskaya, Irina
Author_Institution :
Dipt. di Ing. Ind. e dell´Inf., Univ. degli Studi di Pavia, Pavia, Italy
Volume :
60
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
2343
Lastpage :
2351
Abstract :
Apsel4well is a monolithic active pixel sensor (MAPS) chip intended for application to fast and low material silicon vertex trackers for future experiments at high intensity machines. The design is based on a 180 nm CMOS process with quadruple well option called INMAPS. This technology makes it possible to increase the in-pixel intelligence as compared to standard three transistor MAPS and their variants. Moreover, the availability of a high resistivity epitaxial layer is confirmed to lead to further improvements in terms of charge collection performance and radiation resistance. This paper, after providing some details on the INMAPS process, focuses on the analog front-end section of the pixel readout chain. Measurement results on the main analog channel parameters, like charge sensitivity and equivalent noise charge, are given along with charge collection properties evaluation through 90Sr/ 90Y spectrum measurements and laser stimulation. Characterization data were also used for validating a TCAD model of the device. Finally, selected results from a neutron irradiation campaign with fluences up to 2.7 × 1013 1 MeV neutron equivalent/cm 2 will be shown.
Keywords :
CMOS image sensors; nuclear electronics; readout electronics; silicon radiation detectors; 90Sr/90Y spectrum measurements; Apsel4well chip; CMOS process; INMAPS process; MAPS chip; TCAD model; analog front-end section; charge collection performance; charge sensitivity; equivalent noise charge; fast silicon vertex trackers; high resistivity epitaxial layer; in-pixel intelligence; laser stimulation; main analog channel parameters; monolithic active pixel sensor; neutron irradiation campaign; pixel readout chain; quadruple well CMOS technology; radiation resistance; Capacitance; Charge measurement; Conductivity; Epitaxial layers; Noise; Sensitivity; Standards; CMOS MAPS; low noise design; particle tracking; quadruple well process;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2263428
Filename :
6522909
Link To Document :
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