DocumentCode :
863447
Title :
A wideband 2.4-GHz delta-sigma fractional-NPLL with 1-Mb/s in-loop modulation
Author :
Pamarti, Sudhakar ; Jansson, Lars ; Galton, Ian
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, La Jolla, CA, USA
Volume :
39
Issue :
1
fYear :
2004
Firstpage :
49
Lastpage :
62
Abstract :
A phase noise cancellation technique and a charge pump linearization technique, both of which are insensitive to component errors, are presented and demonstrated as enabling components in a wideband CMOS delta-sigma fractional-N phase-locked loop (PLL). The PLL has a loop bandwidth of 460 kHz and is capable of 1-Mb/s in- loop FSK modulation at center frequencies of 2402 + k MHz for k = 0, 1, 2, ..., 78. For each frequency, measured results indicate that the peak spot phase noise reduction achieved by the phase noise cancellation technique is 16 dB or better, and the minimum suppression of fractional spurious tones achieved by the charge pump linearization technique is 8 dB or better. With both techniques enabled, the PLL achieves a worst-case phase noise of -121 dBc/Hz at 3-MHz offsets, and a worst-case in-band noise floor of -96 dBc/Hz. The PLL circuitry consumes 34.4 mA from 1.8-2.2-V supplies. The IC is realized in a 0.18-μm mixed-signal CMOS process, and has a die size of 2.72 mm × 2.47 mm.
Keywords :
CMOS digital integrated circuits; UHF integrated circuits; delta-sigma modulation; frequency shift keying; linearisation techniques; phase locked loops; phase noise; 0.18 micron; 1 Mbit/s; 1.8 to 2.2 V; 2.4 GHz; 2.47 mm; 2.72 mm; 34.4 mA; 460 kHz; CMOS phase-locked loop; PLL circuitry; center frequencies peak spot phase noise reduction; charge pump linearization technique; component error insensitivity; fractional spurious tone suppression; fractional-N phase-locked loop; in-loop FSK modulation; in-loop modulation; loop bandwidth; mixed-signal CMOS process; phase noise cancellation technique; wideband delta-sigma fractional-NPLL; worst-case in-band noise; worst-case phase noise; Bandwidth; Charge pumps; Current measurement; Delta modulation; Frequency modulation; Frequency shift keying; Linearization techniques; Phase locked loops; Phase noise; Wideband;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.820858
Filename :
1261288
Link To Document :
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