DocumentCode :
863475
Title :
Batch fabrication and operation of GaAs-AlxGa1-x As field-effect transistor-self-electrooptic effect device (FET-SEED) smart pixel arrays
Author :
D´Asaro, L.A. ; Chirovsky, L.M.F. ; Laskowski, E.J. ; Pei, S.S. ; Woodward, T.K. ; Lentine, A.L. ; Leibenguth, R.E. ; Focht, M.W. ; Freund, J.M. ; Guth, G.G. ; Smith, L.E.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
29
Issue :
2
fYear :
1993
fDate :
2/1/1993 12:00:00 AM
Firstpage :
670
Lastpage :
677
Abstract :
The structure, processing, and performance of arrays of integrated field-effect transistor-self-electrooptic effects devices (FET-SEEDs) consisting of doped-channel field-effect transistors, multiple quantum-well (MQW) modulators, and p-i-n MQW detectors are discussed. The performance of the FETs and SEEDs such as gm and contrast, is equivalent to that obtained when they are made separately. Typical values are gm=80 mS/mm and contrast of 3. The largest arrays contain 128 circuits. The circuits operate at speeds as fast as 500 Mb/s, with optical input switching energy of ≈400 fJ. At 170 Mb/s, the required optical input switching energy is ≈70 fJ. This optical energy is at least a factor of 20 less than for symmetric SEEDs (S-SEEDs) with the same optical window sizes. Hence, FET-SEEDs provide superior performance compared to conventional S-SEEDs
Keywords :
III-V semiconductors; SEEDs; aluminium compounds; field effect integrated circuits; gallium arsenide; integrated optoelectronics; optical switches; semiconductor quantum wells; 170 Mbit/s; 400 fJ; 500 Mbit/s; 70 fJ; FET-SEED; GaAs-AlGaAs; III-V semiconductor; MQW modulators; batch fabrication; contrast; doped-channel field-effect transistors; field-effect transistor-self-electrooptic effect device; integrated FET-SEED arrays; operation; optical input switching energy; p-i-n MQW detectors; performance; processing; smart pixel arrays; structure; Absorption; Circuits; Fabrication; Optical bistability; Optical crosstalk; Optical modulation; Optical saturation; Power lasers; Quantum well devices; Voltage;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.199321
Filename :
199321
Link To Document :
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