DocumentCode :
863492
Title :
Study of the Electric Field inside Microchannel Plate Multipliers
Author :
Gatti, E. ; Oba, K. ; Rehak, P.
Author_Institution :
Brookhaven National Laboratory Upton, New York 11973
Volume :
30
Issue :
1
fYear :
1983
Firstpage :
461
Lastpage :
468
Abstract :
Electric field inside high gain microchannel plate multipliers was studied. The calculations were based directly on the solution of the Maxwell equations applied to the microchannel plate (MCP) rather than on the conventional lumped RC model. The results are important to explain the performance of MCP´s, i) under a pulsed bias tension and, ii) at high rate conditions. The results were tested experimentally and a new method of MCP operation free from the positive ion feedback was demonstrated.
Keywords :
Conductivity; Contracts; Electrons; Feedback; Laboratories; Maxwell equations; Microchannel; Performance analysis; TV; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.1983.4332311
Filename :
4332311
Link To Document :
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