DocumentCode :
863518
Title :
Determination of conductivity type from MOS-capacitance measurements
Author :
Heiman, F.P. ; Zaininger, K.H. ; Warfield, G.
Volume :
52
Issue :
7
fYear :
1964
fDate :
7/1/1964 12:00:00 AM
Firstpage :
863
Lastpage :
864
Keywords :
Capacitance measurement; Conducting materials; Conductivity measurement; Gratings; Optical films; Pollution measurement; Space charge; Surface contamination; Testing; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3154
Filename :
1445084
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=863518
