DocumentCode
863537
Title
Radiation Effects in Microelectronics for Space Instruments
Author
Adams, James H., Jr.
Author_Institution
Gamma and Cosmic Ray Astrophysics Branch Naval Research Laboratory Washington, D. C. 20375
Volume
30
Issue
1
fYear
1983
Firstpage
481
Lastpage
484
Abstract
The natural space radiation environment must be considered when microelectronic components are selected for use in space instruments. The designer must be concerned with damage effects due to the total accumulated doses as well as soft upsets and latchup caused by single nuclear events. Methods of estimating the importance of these problems will be discussed and treatments for them will be described.
Keywords
Aerospace electronics; Capacitors; Circuits; DRAM chips; Instruments; Logic; Microelectronics; Nuclear electronics; Radiation effects; Space vehicles;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4332315
Filename
4332315
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