Title :
Radiation Effects in Microelectronics for Space Instruments
Author :
Adams, James H., Jr.
Author_Institution :
Gamma and Cosmic Ray Astrophysics Branch Naval Research Laboratory Washington, D. C. 20375
Abstract :
The natural space radiation environment must be considered when microelectronic components are selected for use in space instruments. The designer must be concerned with damage effects due to the total accumulated doses as well as soft upsets and latchup caused by single nuclear events. Methods of estimating the importance of these problems will be discussed and treatments for them will be described.
Keywords :
Aerospace electronics; Capacitors; Circuits; DRAM chips; Instruments; Logic; Microelectronics; Nuclear electronics; Radiation effects; Space vehicles;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.1983.4332315
