DocumentCode
863627
Title
An 11-bit high-resolution and adjustable-range CMOS time-to-digital converter for space science instruments
Author
Karadamoglou, Kostas ; Paschalidis, Nikolaos P. ; Sarris, Emmanuel ; Stamatopoulos, Nikos ; Kottaras, George ; Paschalidis, Vassilis
Author_Institution
Dept. of Electr. & Comput. Eng., Demokritos Univ. of Thrace, Xanthi, Greece
Volume
39
Issue
1
fYear
2004
Firstpage
214
Lastpage
222
Abstract
An 11-bit time-to-digital converter (TDC) with high time resolution implemented in CMOS VLSI is presented. The TDC operates with a wide and clock-adjustable resolution of LSB = 50 ps to 1 ns, and with good power supply, temperature, and environmental effects compensation. The dead time of the measurement is as low as 0.5 μs and the event rate can be as high as 1 MEvents/s. The power dissipation is a function of event rate and clock frequency; the TDC dissipates <10 mW at an event rate of 100 kEvents/s and LSB=100 ps. The TDC was incorporated in a complete time-of-flight (TOF) system on a chip that in addition included front-end analog signal processing. The TOF chip is already flying onboard the HENA (High Energy Neutral Atoms) instrument of the IMAGE NASA mission, launched in 2000, and is part of many other instruments such as particles, X-ray, and the laser altimeter of the Messenger spacecraft.
Keywords
CMOS integrated circuits; VLSI; convertors; delay lock loops; high-speed integrated circuits; space vehicle electronics; 10 mW; 11-bit high-resolution time-to-digital converter; CMOS VLSI; CMOS time-to-digital converter; HENA instrument; High Energy Neutral Atoms; IMAGE NASA mission; Messenger spacecraft; TOF system; X-ray; adjustable-range time-to-digital converter; clock frequency; clock-adjustable resolution; delay-locked loop; environmental effects compensation; event rate; front-end analog signal processing; high time resolution; laser altimeter; power dissipation; power supply; rate frequency; space science instruments; system on a chip; temperature effects compensation; time-of-flight system; Clocks; Frequency; Instruments; Power dissipation; Power supplies; Signal processing; Temperature; Time measurement; Very large scale integration; X-ray lasers;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2003.817263
Filename
1261303
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