DocumentCode :
863633
Title :
Microwave measurement of surface conductance of semiconductors
Author :
Roy, Sandip Kumar ; Nag, B.R.
Volume :
52
Issue :
7
fYear :
1964
fDate :
7/1/1964 12:00:00 AM
Firstpage :
873
Lastpage :
874
Keywords :
Conductivity; Dielectric constant; Equations; Frequency; Germanium; Microwave measurements; Scattering; Silicon; Slabs; Surface waves;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3165
Filename :
1445095
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=863633
