DocumentCode :
863992
Title :
Incident angle dependence of recording characteristics of vacuum deposited Co-Cr films
Author :
Sugita, R. ; Echigo, N. ; Tohma, K. ; Yamamitsu, C.
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Volume :
26
Issue :
5
fYear :
1990
fDate :
9/1/1990 12:00:00 AM
Firstpage :
2286
Lastpage :
2288
Abstract :
The authors report on an investigation of the relation between the incidence angle of evaporated atoms onto a substrate and the magnetic properties, microstructure, and recording characteristics of Co-Cr films. The Co-Cr films deposited at an oblique incidence angle have an easy axis of magnetization which tilts from the film normal and consist of columnar grains which tilt from the film normal. For films deposited at an incidence angle from 55° to 20°, the isolated pulse waveform is not a double pulse, but a single-peak-like pulse with narrow pulse width. An eye pattern for moving-picture digital recording was clearly observed using the Co-Cr tapes. The compensation amplitude in the short wavelength region was very small, and equalization such as a Hilbert transform was unnecessary for films deposited at an incidence angle from 55° to 20 °
Keywords :
chromium alloys; cobalt alloys; magnetic tapes; magnetic thin films; vacuum deposited coatings; Co-Cr; Hilbert transform; columnar grains; compensation amplitude; evaporated atoms; eye pattern; incidence angle; isolated pulse waveform; magnetic properties; magnetization; microstructure; moving-picture digital recording; recording characteristics; short wavelength region; Atomic layer deposition; Ferrite films; Magnetic films; Magnetic properties; Magnetic recording; Microstructure; Perpendicular magnetic recording; Space vector pulse width modulation; Substrates; Vacuum systems;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.104699
Filename :
104699
Link To Document :
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