Title :
Mixer and tangential sensitivity measurements on evaporated metal semiconductor diodes at 1 and 10Gc
Author :
Herndon, M. ; Macpherson, A.C.
Keywords :
Current measurement; Manufacturing; Microwave measurements; Microwave theory and techniques; Noise figure; Pulse shaping methods; Reproducibility of results; Semiconductor diodes; Signal to noise ratio; Testing;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/PROC.1964.3202
