Title :
Near-Optimal Equalizer and Timing Adaptation for I/O Links Using a BER-Based Metric
Author :
E-Hung Chen ; Jihong Ren ; Leibowitz, B. ; Hae-Chang Lee ; Qi Lin ; Kyung Oh ; Lambrecht, F. ; Stojanovic, V. ; Zerbe, J. ; Yang, C.-K.K.
Author_Institution :
Univ. of California, Los Angeles, CA
Abstract :
A new adaptation strategy of I/O link equalizers is presented based on minimizing the bit error rate (BER) as the objective function to maximize the receiver voltage margin. The adaptation strategy is verified in a 90-nm test chip on both the transmitter finite-impulse response filter (Tx-FIR) and the receiver decision-feedback equalizer (Rx-DFE). The performance is compared with the commonly used sign-sign least mean square (SS-LMS) adaptation and demonstrates significant improvements especially in the case of the Tx-FIR. This paper also demonstrates that in a highly attenuating system that contains both a Tx-FIR and Rx-DFE, using a Tx-FIR subject to peak output power constraint to compensate pre-cursor ISI is worse than solely using an Rx-DFE. The adaptation strategy is further applied to adapt the sampling phase of the clock-and-data recovery loop (CDR). The technique enables near-optimal BER performance by substantially reducing the pre-cursor ISI and requires almost no additional hardware compared to SS-LMS adaptation.
Keywords :
FIR filters; adaptive equalisers; decision feedback equalisers; error statistics; least mean squares methods; synchronisation; telecommunication links; BER; CDR; I/O links; ISI; Rx-DFE; SS-LMS; Tx-FIR; bit error rate; clock-and-data recovery loop; intersymbol interference; near-optimal equalizer; receiver decision-feedback equalizer; sign-sign least mean square method; test chip; timing adaptation; transmitter finite-impulse response filter; voltage margin; Bit error rate; Decision feedback equalizers; Filters; Intersymbol interference; Power generation; Sampling methods; Testing; Timing; Transmitters; Voltage; Adaptation; CDR; I/O link; ISI; bit error rate (BER); equalizer; pre-cursor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.2001871