DocumentCode :
864169
Title :
Observations of negative–resistance phenomena and oscillations in the MOS diode
Author :
Hayashi, Teruaki ; Niimi, Takuya
Volume :
52
Issue :
8
fYear :
1964
Firstpage :
986
Lastpage :
986
Keywords :
Conductivity; Diodes; Semiconductor films; Silicon; Voltage;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1964.3214
Filename :
1445144
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=864169
