Title :
Narrowband multifrequency binary measurement using phase shift keyed symbols
Author :
Henderson, Ian A. ; McGhee, Joseph ; Muhaisni, Musaed Al
Author_Institution :
Dept. of Electron. & Electr. Eng., Strathclyde Univ., Glasgow, UK
fDate :
12/1/1992 12:00:00 AM
Abstract :
Multifrequency binary testing (MBT), which uses multifrequency binary sequence (MBS) test signals, with high signal-to-noise power ratios for their dominant harmonics, to measure frequency response is considered. Information theory, in the form of descriptive languages and codes, digital modulation, and redundancy is used to design novel phase-shift-keyed (PSK) MBS symbols. A signal zooming operation, similar to optical zooming, is used to allow narrowband frequency response measurement with a high spectral resolution
Keywords :
frequency measurement; frequency response; harmonic analysis; phase shift keying; signal processing; codes; descriptive languages; digital modulation; frequency response; information theory; multifrequency binary sequence; narrowband frequency response measurement; narrowband multifrequency binary measurement; phase shift keyed symbols; redundancy; signal zooming; signal-to-noise power ratios; Binary sequences; Digital modulation; Frequency measurement; Frequency response; Information theory; Narrowband; Phase measurement; Power measurement; Power system harmonics; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
