DocumentCode
86427
Title
GaN: A Reliable Future in Power Conversion: Dramatic performance improvements at a lower cost
Author
Lidow, Alex ; Strydom, Johan ; Strittmatter, Robert ; Chunhua Zhou
Volume
2
Issue
1
fYear
2015
fDate
Mar-15
Firstpage
20
Lastpage
26
Abstract
For the first time in 60 years, a new, higher-performance technology is less expensive to produce than its silicon counterpart. Gallium nitride (GaN), grown as a thin layer on top of a standard silicon substrate, has demonstrated both a dramatic improvement in transistor performance [1] and the ability to be produced at a lower cost than its aging silicon ancestors. Enhancement-mode GaN transistors have unleashed new applications because of their ability to switch higher voltages and higher currents faster than any transistor before. In this article, we will discuss the status of the technology in terms of device performance, cost, and product reliability.
Keywords
III-V semiconductors; gallium compounds; semiconductor device reliability; transistors; wide band gap semiconductors; device cost; device performance; enhancement-mode gallium nitride transistors; higher-performance technology; power conversion; product reliability; standard silicon substrate; transistor performance; Gallium nitride; Performance evaluation; Power conversion; Silicon; Substrates; Switching circuits; Transistors;
fLanguage
English
Journal_Title
Power Electronics Magazine, IEEE
Publisher
ieee
ISSN
2329-9207
Type
jour
DOI
10.1109/MPEL.2014.2381457
Filename
7054053
Link To Document