• DocumentCode
    86427
  • Title

    GaN: A Reliable Future in Power Conversion: Dramatic performance improvements at a lower cost

  • Author

    Lidow, Alex ; Strydom, Johan ; Strittmatter, Robert ; Chunhua Zhou

  • Volume
    2
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    20
  • Lastpage
    26
  • Abstract
    For the first time in 60 years, a new, higher-performance technology is less expensive to produce than its silicon counterpart. Gallium nitride (GaN), grown as a thin layer on top of a standard silicon substrate, has demonstrated both a dramatic improvement in transistor performance [1] and the ability to be produced at a lower cost than its aging silicon ancestors. Enhancement-mode GaN transistors have unleashed new applications because of their ability to switch higher voltages and higher currents faster than any transistor before. In this article, we will discuss the status of the technology in terms of device performance, cost, and product reliability.
  • Keywords
    III-V semiconductors; gallium compounds; semiconductor device reliability; transistors; wide band gap semiconductors; device cost; device performance; enhancement-mode gallium nitride transistors; higher-performance technology; power conversion; product reliability; standard silicon substrate; transistor performance; Gallium nitride; Performance evaluation; Power conversion; Silicon; Substrates; Switching circuits; Transistors;
  • fLanguage
    English
  • Journal_Title
    Power Electronics Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2329-9207
  • Type

    jour

  • DOI
    10.1109/MPEL.2014.2381457
  • Filename
    7054053