• DocumentCode
    864349
  • Title

    Magnetic levitation using high-temperature superconductors: a materials perspective

  • Author

    Chen, Q.Y.

  • Author_Institution
    Texas Center for Supercond., Houston Univ., TX, USA
  • Volume
    41
  • Issue
    6
  • fYear
    1992
  • fDate
    12/1/1992 12:00:00 AM
  • Firstpage
    824
  • Lastpage
    828
  • Abstract
    The relationships between system parameters and material properties for a superconducting levitation (or suspension) system are investigated. A superconducting levitation measurement system, constructed to produce 5-T uniform magnetic field and ~1-T/cm uniform gradient in static mode, was used to measure the levitation of high-temperature superconductors. Up to 0.5 T/cm of the gradient field may also be pulsed with switching time ~0.1 s which was designed to perturb freely levitated superconductors in dynamic measurements. The displacement of the levitated sample was monitored using phase-sensitive inductive techniques which provided the magnitude of a magnetic force. The control of temperature and magnetic field, as well as the data acquisition, was done through an IEEE-488 interface and a 9-μs analog-to-digital converter (ADC) using an 80386-based personal computer. The measurements and the theoretical analysis are compared
  • Keywords
    computerised instrumentation; displacement measurement; high-temperature superconductors; magnetic levitation; magnetic variables measurement; 5 T; 80386-based personal computer; IEEE-488 interface; analog-to-digital converter; control of temperature; data acquisition; high-temperature superconductors; magnetic force; magnetic levitation; phase-sensitive inductive techniques; static mode; superconducting levitation measurement system; suspension; Computerized monitoring; High temperature superconductors; Magnetic field measurement; Magnetic forces; Magnetic levitation; Material properties; Pulse measurements; Superconducting materials; Temperature control; Time measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.199416
  • Filename
    199416