DocumentCode :
864349
Title :
Magnetic levitation using high-temperature superconductors: a materials perspective
Author :
Chen, Q.Y.
Author_Institution :
Texas Center for Supercond., Houston Univ., TX, USA
Volume :
41
Issue :
6
fYear :
1992
fDate :
12/1/1992 12:00:00 AM
Firstpage :
824
Lastpage :
828
Abstract :
The relationships between system parameters and material properties for a superconducting levitation (or suspension) system are investigated. A superconducting levitation measurement system, constructed to produce 5-T uniform magnetic field and ~1-T/cm uniform gradient in static mode, was used to measure the levitation of high-temperature superconductors. Up to 0.5 T/cm of the gradient field may also be pulsed with switching time ~0.1 s which was designed to perturb freely levitated superconductors in dynamic measurements. The displacement of the levitated sample was monitored using phase-sensitive inductive techniques which provided the magnitude of a magnetic force. The control of temperature and magnetic field, as well as the data acquisition, was done through an IEEE-488 interface and a 9-μs analog-to-digital converter (ADC) using an 80386-based personal computer. The measurements and the theoretical analysis are compared
Keywords :
computerised instrumentation; displacement measurement; high-temperature superconductors; magnetic levitation; magnetic variables measurement; 5 T; 80386-based personal computer; IEEE-488 interface; analog-to-digital converter; control of temperature; data acquisition; high-temperature superconductors; magnetic force; magnetic levitation; phase-sensitive inductive techniques; static mode; superconducting levitation measurement system; suspension; Computerized monitoring; High temperature superconductors; Magnetic field measurement; Magnetic forces; Magnetic levitation; Material properties; Pulse measurements; Superconducting materials; Temperature control; Time measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.199416
Filename :
199416
Link To Document :
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