Title :
A Compact Physical AlGaN/GaN HFET Model
Author :
Danqiong Hou ; Bilbro, Griff L. ; Trew, R.J.
Author_Institution :
ECE Dept., North Carolina State Univ., Raleigh, NC, USA
Abstract :
We introduce a physics-based compact model for AlGaN/GaN heterojunction field-effect transistors (HFETs) that is suitable for both RF microwave and switched-mode power supply (SMPS) applications, so that RF techniques can help determine HFET performance in SMPS applications. Such simulations can predict the on-resistance, slew rate, and breakdown voltage from the physical design of the transistor. Starting from an expression for the drain-source conduction current, charge distribution and displacement current are determined. The new model was implemented in Verilog-A and implemented in AWRDE, the design environment from Applied Wave Research. The HFET model was validated by comparison with Silvaco simulations and with data from an AlGaN/GaN HFET S-band amplifier. The new model accurately predicts device performance for dc, small-signal, and large-signal operations.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; microwave field effect transistors; semiconductor device models; switched mode power supplies; wide band gap semiconductors; AWRDE; AlGaN-GaN; Applied Wave Research; DC operation; HFET S-band amplifier; RF microwave application; SMPS application; Silvaco simulations; Verilog-A; breakdown voltage; charge distribution; compact physical HFET model; displacement current; drain-source conduction current; heterojunction field-effect transistors; large-signal operation; on-resistance; slew rate; small-signal operation; switched-mode power supply application; transistor physical design; Aluminum gallium nitride; Gallium nitride; HEMTs; Integrated circuit modeling; Logic gates; MODFETs; Radio frequency; AlGaN/GaN heterojunction field-effect transistor (FET) (HFET) models; HFET compact models; nitride-based HFETs;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2227323