Title :
InAs/GaSb Superlattice Detectors Operating at Room Temperature
Author :
Plis, Elena ; Lee, Sang Jun ; Zhu, Zhimei ; Amtout, Abdenour ; Krishna, Sanjay
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM
Abstract :
We have investigated mid-infrared detectors based on type-II transitions in InAs/GaSb strain layer superlattices (SLS). The SLS heterostructures were grown by solid source molecular beam epitaxy and were characterized by double crystal X-ray diffraction, transmission electron microscopy, photoluminescence and absorption measurements. The effect of aqueous ammonium sulfide passivation was investigated using picosecond excitation correlation (PEC) and variable array diode analysis (VADA). The surface recombination velocity was estimated to be 9.5times105 cm/s for the unpassivated sample and 4.0times105 cm/s for the passivated sample. NIP diodes were grown and fabricated with 300 periods of 8 ML InAs/8 ML GaSb SLS in the active region. Spectral response with lambdacut-off~5mum was observed at room temperature with a Johnson noise limited D* =4.6times109 cm.Hz1/2/W and a conversion quantum efficiency of 67% at Vb=-0.3 V. Scattering in the substrate was ignored for these measurements
Keywords :
X-ray diffraction; gallium compounds; indium compounds; infrared detectors; molecular beam epitaxial growth; passivation; photodetectors; photoluminescence; semiconductor device noise; semiconductor growth; semiconductor superlattices; surface recombination; thermal noise; transmission electron microscopy; 67 percent; InAs-GaSb; InAs/GaSb strain layer superlattices; InAs/GaSb superlattice detectors; Johnson noise; aqueous ammonium sulfide passivation; double crystal X-ray diffraction; midinfrared detectors; photoluminescence; picosecond excitation correlation; quantum efficiency; solid source molecular beam epitaxy; surface recombination velocity; transmission electron microscopy; variable array diode analysis; Capacitive sensors; Detectors; Diodes; Electron beams; Laser sintering; Molecular beam epitaxial growth; Solids; Superlattices; Temperature; X-ray diffraction; Charge carrier; infrared image sensors; passivation; semiconductor growth; superlattices;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2006.882641