Waveform based MOSFET dynamic large-signal parameter estimation

A multifunctional time domain modelling large-signal data acquisition system is used to acquire and to extract the intrinsic parameters of a MOSFET using only one waveform measurement. The measurement is performed at the operating frequency of 2.4 GHz, selected for the Bluetooth wireless networking protocol. Details of the nonlinear measurement system are provided and its application in the new extraction procedure described. Validation of the extracted parameters is referenced to traditional S-parameter extraction methods and measured large-signal measurements.