• DocumentCode
    864659
  • Title

    Waveform based MOSFET dynamic large-signal parameter estimation

  • Author

    Toner, B. ; Fusco, V.F.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Queens Univ. of Belfast, UK
  • Volume
    150
  • Issue
    6
  • fYear
    2003
  • fDate
    12/1/2003 12:00:00 AM
  • Firstpage
    451
  • Lastpage
    458
  • Abstract
    A multifunctional time domain modelling large-signal data acquisition system is used to acquire and to extract the intrinsic parameters of a MOSFET using only one waveform measurement. The measurement is performed at the operating frequency of 2.4 GHz, selected for the Bluetooth wireless networking protocol. Details of the nonlinear measurement system are provided and its application in the new extraction procedure described. Validation of the extracted parameters is referenced to traditional S-parameter extraction methods and measured large-signal measurements.
  • Keywords
    MOSFET; S-parameters; UHF field effect transistors; electric variables measurement; parameter estimation; semiconductor device models; 2.4 GHz; Bluetooth; MOSFET; S-parameter extraction methods; large-signal data acquisition; large-signal parameter estimation; multifunctional time domain modelling; nonlinear measurement system;
  • fLanguage
    English
  • Journal_Title
    Microwaves, Antennas and Propagation, IEE Proceedings
  • Publisher
    iet
  • ISSN
    1350-2417
  • Type

    jour

  • DOI
    10.1049/ip-map:20031012
  • Filename
    1261681